A scanning electron microscope (SEM) is a microscope that works by scanning a focused electron beam on a sample of interest. The main SEM components include:
• Electronic source
• Electronic travel through electromagnetic lens
• Electronic detectors
•Sample room
• Computers and monitors can view images
At the top of the column, electrons are generated, accelerated downwards and passed through a combination of lens and aperture to produce a focused electron beam that strikes the surface of the sample. The sample is mounted on the stage of the chamber area unless the microscope is designed to operate under low vacuum, otherwise, the column and chamber are evacuated by a combination of pumps. The degree of vacuum depends on the design of the microscope.
The position of the electron beam on the sample is controlled by a scan coil located above the objective lens. These coils allow scanning of the beam on the sample surface. For SEM Services in Lahore.We provide in Pakistan. According to the name of the microscope, this beam scanning or scanning makes it possible to collect information about the area defined in the sample. As a result of the electron-sample interaction, many signals are generated. These signals are then detected by appropriate detectors.
